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Cadence Modus DFT

The Modus page describes DFT insertion, ATPG, memory BIST, logic BIST, and single- and multi-die diagnostics.

View Official Source (opens in a new tab)Browse DFT

Overview

It is an EDA tool, not automated test equipment.

Cadence states test-time reduction of up to 3X and compression beyond 400X. Those figures are provider-stated and were not remeasured. The page does not describe an ATE system. Which of the named features are in a given configuration needs confirmation.

Lifecycle and categories

Lifecycle stages
Synthesis and DFT
Solution categories
DFT

Related solutions

Synopsys TestMAX

DFT

Synopsys TestMAX is a design-for-test family covering testability analysis, ATPG compression, logic BIST, memory self-test and repair, and analog fault simulation. It is an EDA tool, not automated test equipment.

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