ACTIS
Test and qualificationLasertec ACTIS is an actinic EUV photomask inspection platform for high-volume EUV mask qualification.
View solutionTest and qualification
ATE, characterization, compliance and reliability testing.
Showing 1–9 of 9 solutions.
Provider
ACTIS
Test and qualificationComposite-Metal MEMS Probe Technology
Test and qualification
FormFactor composite-metal MEMS is a wafer-probe-card technology, not a MEMS sensor product.
View solutionDiamondx
Test & Qualification
Cohu Diamondx is semiconductor ATE instrumentation, not a handler and not a probe card.
View solutionFOX-XP
Test & Qualification
Aehr FOX-XP is a multi-wafer burn-in and test system, not a packaged-device ATE rack and not a probe card.
View solutionMEMS-SP Probe Card
Test and qualification
Micronics Japan MEMS-SP is a MEMS probe-card technology for wafer test, not a handler and not a packaged-device socket.
View solutionMosChip Silicon Engineering Services
Design Services
Silicon engineering services. Physical design and sign-off are documented on the design-services page. Package, assembly, ATE test, and qualification are documented on the turnkey page as coordination with foundry and OSAT partners.
View solutionTPEG Vertical MEMS Probe Technology
Test and qualification
Technoprobe TPEG Vertical MEMS is a named probe-card technology for wafer test, not a finished tester or a MEMS sensor product.
View solutionV93000 EXA Scale
Test & Qualification
Advantest V93000 EXA Scale is a flagship SoC automatic test equipment platform for high-volume digital, mixed-signal and high-speed I/O devices.
View solutionimec IC-link ASIC development
Design Services
ASIC services through imec IC-link, including package design, assembly through partner assembly houses, and test and qualification through partner test houses. Physical design and timing signoff are not named on the reviewed pages.
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