
SC26
- November 15 – 20, 2026
- Chicago, Illinois, USA
- Organized by SC Conference Series
Public source
ACTIS is a publicly named Lasertec actinic EUV mask inspection family, including the ACTIS A300 product page.
Lasertec ACTIS is an actinic EUV photomask inspection platform for high-volume EUV mask qualification.
Official Lasertec pages present ACTIS as inspection of EUV masks at actinic wavelength. This listing records the ACTIS platform rather than every inspection tool Lasertec sells. Configuration details should be confirmed on Lasertec’s current ACTIS pages.
Mask qualification rather than wafer defect inspection
FormFactor composite-metal MEMS is a wafer-probe-card technology, not a MEMS sensor product.
View solutionCohu Diamondx is semiconductor ATE instrumentation, not a handler and not a probe card.
View solutionAehr FOX-XP is a multi-wafer burn-in and test system, not a packaged-device ATE rack and not a probe card.
View solutionMicronics Japan MEMS-SP is a MEMS probe-card technology for wafer test, not a handler and not a packaged-device socket.
View solutionSilicon engineering services. Physical design and sign-off are documented on the design-services page. Package, assembly, ATE test, and qualification are documented on the turnkey page as coordination with foundry and OSAT partners.
View solutionTechnoprobe TPEG Vertical MEMS is a named probe-card technology for wafer test, not a finished tester or a MEMS sensor product.
View solution