NOV152026
Conference
SC26
- November 15 – 20, 2026
- Chicago, Illinois, USA
- Organized by SC Conference Series
Public source
MEMS-SP Probe Card
MEMS-SP Probe Card is a publicly named MJC MEMS probe-card family.
Overview
Micronics Japan MEMS-SP is a MEMS probe-card technology for wafer test, not a handler and not a packaged-device socket.
Official MEMS-SP pages describe spring-pin MEMS probes for high-pin-count wafer test in logic, memory and automotive devices. This listing records the MEMS-SP probe-card technology rather than every MJC card SKU.
Lifecycle and categories
- Lifecycle stages
- Test and qualification
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