MULTI-WAFER BURN-IN AND
Multi-wafer burn-in and test system
Multi-wafer burn-in and test system
Wafer-level reliability test rather than packaged ATE
Automotive · AI & HPC · Energy
Public source
FOX-XP is a publicly named Aehr wafer-level burn-in and test platform.
Silicon Showcase illustrative visual
Illustrative representation based on publicly available technical information.
Aehr FOX-XP is a multi-wafer burn-in and test system, not a packaged-device ATE rack and not a probe card.
Official Aehr FOX-XP materials describe multi-wafer chambers used for silicon carbide, silicon photonics and other devices that need wafer-level reliability stress. This listing records FOX-XP rather than every FOX-family SKU.
Key characteristics associated with this technology.
Multi-wafer burn-in and test system
Wafer-level reliability test rather than packaged ATE
Not a probe-card listing
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